Fluke MET/CAL Procedure ============================================================================= INSTRUMENT: Fluke 29-2: (1 year) CAL VER /5500 INSTRUMENT: Fluke 79-2: (1 year) CAL VER /5500 DATE: 16-Sep-97 AUTHOR: Fluke Corporation REVISION: $Revision: 1.3 $ ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 44 NUMBER OF LINES: 197 CONFIGURATION: Fluke 5500A ============================================================================= # # Source: # Fluke 79/29 Series II Service Manual # (PN 896209 July 1991, Rev. 2, 1/94, Errata No. 1 11/94) # # Compatibility: # 5500/CAL 4.0 or MET/CAL 4.0 or later # # Subprocedures: # None # # Required Files: # 55_2x_CW.bmp # 55_2x_2W.bmp # 55_2x_LA.bmp # 55_2x_HA.bmp # 55_7x_CW.bmp # 55_7x_2W.bmp # 55_7x_LA.bmp # 55_7x_HA.bmp # # System Specifications: # TUR calculation is based on specification interval of the accuracy file. # The default 5500A accuracy file contains 90 day specs. # # Fluke makes no warranty, expressed or implied, as to the fitness # or suitability of this procedure in the customer's application. # # The 90 day specifications of the 5500A are used in TUR computations. # STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R P F W 1.002 ASK+ K 1.003 HEAD PRELIMINARY INSTRUCTIONS 1.004 DISP [32] WARNING 1.004 DISP HIGH VOLTAGE is used or exposed during the performance 1.004 DISP of this calibration. DEATH ON CONTACT may result if 1.004 DISP personnel fail to observe safety precautions. 1.005 DISP Allow the UUT to stablize to room temperature 1.005 DISP 23degC +/-5degC (73degF +/-9degF). 1.005 DISP 1.005 DISP Check the fuses and battery, and replace them if 1.005 DISP necessary. 1.006 HEAD {DISPLAY TEST} 1.007 DISP Rotate the UUT function switch from OFF to VAC. 1.007 DISP AS the UUT is turned ON, verify that all display 1.007 DISP segments momentarily light up. 1.008 EVAL Did the UUT display test pass? 2.001 HEAD {AC VOLTAGE TESTS} 2.002 JMPT 2.005 Fluke 29-2: (1 year) CAL VER /5500 2.003 PIC 55_7x_2W 2.004 JMP 2.006 2.005 PIC 55_2x_2W 2.006 HEAD AC VOLTAGE TESTS: {400mV Range} 2.007 5500 0.0mV S 2W 2.008 MEMI Enter UUT reading in volts AC: 2.009 MEME 2.010 MEMC 400 mV +0.4U 3.001 5500 400 350.0mV 7.1U 100H SI 2W 4.001 5500 400 350.0mV 7.1U 1kH SI 2W 5.001 HEAD AC VOLTAGE TESTS: {4V Range} 5.002 DISP Press the push button twice to select the 4V Range. 5.003 5500 0.000V S 2W 5.004 MEMI Enter UUT reading in volts AC: 5.005 MEME 5.006 MEMC 4 V +0.002U 6.001 5500 4 3.500V 0.069U 100H SI 2W 7.001 5500 4 3.500V 0.069U 1kH SI 2W 8.001 HEAD AC VOLTAGE TESTS: {40V Range} 8.002 DISP Press the push button for 2s to select autorange. 8.003 5500 40 35.00V 0.37U 1kH SI 2W 9.001 HEAD AC VOLTAGE TESTS: {400V Range} 9.002 5500 400 350.0V 3.7U 1kH SI 2W 10.001 HEAD AC VOLTAGE TESTS: {750V Range} 10.002 5500 750 750V 10U 1kH SI 2W 11.001 HEAD {FREQUENCY TEST} 11.002 DISP Rotate the UUT function switch to Hz. 11.003 5500 800.0H 0.2U 300mV SI 2W 12.001 5500 20.00kH 0.01U 300mV SI 2W 13.001 HEAD {DC VOLTAGE TESTS} 13.002 DISP Rotate the UUT function switch to VDC. 13.003 HEAD DC VOLTAGE TESTS: {4V Range} 13.004 5500 4 0.000V 0.001U 2W 14.001 5500 4 3.500V 0.012U 2W 15.001 MATH M[1] = MEM1 15.002 5500 4 -3.500V 0.012U 2W 16.001 MATH M[2] = MEM1 16.002 HEAD DC VOLTAGE TESTS: {4V Range, +/- reading difference} # RSS sys tol = sqrt(2 * (190e-6)^2) 16.003 ACC 0V 2.687e-4U 16.004 MATH MEM = M[1] + M[2] 16.005 MEME 16.006 MEMC V 0.002U 17.001 HEAD DC VOLTAGE TESTS: {40V Range} 17.002 5500 40 35.00V 0.12U 2W 18.001 HEAD DC VOLTAGE TESTS: {400V Range} 18.002 5500 400 350.0V 1.2U 2W 19.001 HEAD DC VOLTAGE TESTS: {1000V Range} 19.002 5500 1000 1000V 4U 2W 20.001 HEAD {DC MILLIVOLT TEST} 20.002 DISP Rotate the UUT function switch to mVDC. 20.002 DISP Press push button for 1s to select autorange. 20.003 HEAD DC MILLIVOLT TEST: {400mV Range} 20.004 5500 400 350.0mV 1.2U 2W 21.001 HEAD DC MILLIVOLT TEST: {40mV Range} 21.002 5500 40 0.00mV 0.05U 2W 22.001 5500 40 35.00mV 0.16U 2W 23.001 5500 40 -35.00mV 0.16U 2W 24.001 ASK- U 24.002 HEAD {CONTINUITY TEST} 24.003 DISP Rotate the UUT function switch to Continuity >>)). 24.004 5500 0.0Z S 2W 24.005 EVAL Is the {beeper on}? 25.001 EVAL Is the {beeper off}? 26.001 EVAL Is UUT displaying the {overload indicator} (-OL.-)? 27.001 HEAD {DIODE TEST} 27.002 DISP Press the push button for 2s to select Diode (VDC) 27.003 5500 0.0Z S 2W 27.004 EVAL Is the {beeper on}? 28.001 EVAL Is the {beeper off}? 29.001 EVAL Is UUT displaying the {overload indicator} (-OL.-)? 30.001 DISP Disconnect the 5500A from the UUT. 30.002 HEAD {CAPACITANCE TESTS} 30.003 DISP Rotate the UUT function switch to Ohm. 30.003 DISP Press the push button for 2s to select Capacitance. 30.004 HEAD CAPACITANCE TESTS: {100nF Range} 30.005 MATH MEM1 = 0 30.006 MEMI Enter UUT reading in nanofarads: 30.007 MEME 30.008 MEMC 100 nF +0.5U 31.001 HEAD CAPACITANCE TESTS: {1000nF Range} 31.002 DISP Press the push button twice to select the 1000nF Range. 31.003 MATH MEM1 = 0 31.004 MEMI Enter UUT reading in nanofarads: 31.005 MEME 31.006 MEMC 1000 nF +5U 32.001 ASK+ U 32.002 JMPT 32.005 Fluke 29-2: (1 year) CAL VER /5500 32.003 PIC 55_7x_2W 32.004 JMP 32.006 32.005 PIC 55_2x_2W 32.006 5500 1000 800.0nF 15.4U 2W 33.001 HEAD CAPACITANCE TESTS: {10uF Range} 33.002 DISP Press the push button to select the 10uF Range. 33.003 5500 10 1.100uF 0.023U 2W 34.001 HEAD {RESISTANCE TESTS} 34.002 DISP Press the push button for 2s to select Ohms. 34.003 HEAD RESISTANCE TESTS: {40 MOhm Range} 34.004 5500 40 19.00MZ 0.22U 2W 35.001 HEAD RESISTANCE TESTS: {4M Ohm Range} 35.002 5500 4 3.500MZ 0.015U 2W 36.001 HEAD RESISTANCE TESTS: {400 kOhm Range} 36.002 5500 400 350.0kZ 1.5U 2W 37.001 HEAD RESISTANCE TESTS: {40 kOhm Range} 37.002 JMPT 37.005 Fluke 29-2: (1 year) CAL VER /5500 37.003 PIC 55_7x_CW 37.004 JMP 37.006 37.005 PIC 55_2x_CW 37.006 5500 40 35.00kZ 0.15U CW 38.001 HEAD RESISTANCE TESTS: {4 kOhm Range} 38.002 5500 4 3.500kZ 0.015U CW 39.001 HEAD RESISTANCE TESTS: {400 Ohm Range} 39.002 5500 400 350.0Z 1.6U CW 40.001 5500 400 0.0Z +0.2U CW 41.001 HEAD {DC MILLIAMP TEST} 41.002 DISP Rotate the UUT function switch to Amps DC. 41.003 JMPT 41.006 Fluke 29-2: (1 year) CAL VER /5500 41.004 PIC 55_7x_LA 41.005 JMP 41.007 41.006 PIC 55_2x_LA 41.007 HEAD DC MILLIAMP TESTS: {40mA Range} 41.008 5500 40 35.00mA 0.20U 2W 42.001 HEAD {AC MILLIAMP TESTS} 42.002 DISP Press the push button for 2s to select AC. 42.003 HEAD AC MILLIAMP TESTS: {40mA Range} 42.004 5500 40 35.00mA 0.55U 1kH SI 2W 43.001 HEAD {DC AMP TEST} 43.002 JMPT 43.005 Fluke 29-2: (1 year) CAL VER /5500 43.003 PIC 55_7x_HA 43.004 JMP 43.006 43.005 PIC 55_2x_HA 43.006 DISP Press the push button for 2s to select DC. 43.007 HEAD DC AMP TESTS: {10A Range} 43.008 5500 10 10.00A 0.07U 2W 44.001 END